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Table of topological defect components typically found in BCP thin film nanopatterns.

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posted on 24.07.2015, 04:10 by Jeffrey N. Murphy, Kenneth D. Harris, Jillian M. Buriak

Shown are each major type of component defect, as exists in either the positive (e.g. P2VP) phase or the negative (e.g. PS) phase. For each, 3-branch junctions, terminal points, and dots, examples are given with defects highlighted by a magenta dot. This analysis is done relative to an ideal striped pattern without any interrupting features, save for the edge of the image.

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