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Representative images of presence of biofilm deposition within the implant site in group IV by Scanning electron microscopy (SEM) analysis.

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posted on 2013-06-20, 02:07 authored by Arianna B. Lovati, Lorenzo Drago, Lorenzo Monti, Elena De Vecchi, Sara Previdi, Giuseppe Banfi, Carlo L. Romanò

Presence of biofilm deposition on the cut ends of the implants (*) within the intercondylar notch (A, scale bar 200 µm), the implant-bone interface in the boxed area (B, scale bar 10 µm), and the opposite edge of the implanted nail (**) within the medullary canal (C, scale bar 100 µm) in the boxed area (D, scale bar 20 µm, small box 10 µm) are shown in group IV.

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