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ROMK mutations from TOPMed and ClinVar show varying growth defects in yeast in low potassium medium.

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posted on 2023-11-13, 18:50 authored by Nga H. Nguyen, Srikant Sarangi, Erin M. McChesney, Shaohu Sheng, Jacob D. Durrant, Aidan W. Porter, Thomas R. Kleyman, Zachary W. Pitluk, Jeffrey L. Brodsky

(A) Schematic of a yeast-based assay to assess the activity of a human potassium channel. A yeast strain lacking endogenous potassium transporters, Trk1 and Trk2, is viable, yet unable to grow on medium containing low potassium, unless a human potassium channel (e.g., Kir2.1 or ROMK) is expressed. Because of impaired ROMK activity at low pH [84] and exaggerated steady-state residence in the ER [51], ROMK exhibits only a weak growth phenotype on low potassium in contrast to Kir2.1. The table shows the expected growth phenotype of yeast containing an empty vector, or expressing a related Kir channel, Kir2.1, or ROMK, and the predicted growth phenotype of yeast expressing a ROMK mutation from Fig 1. (B) Viability assays of yeast expressing 17 TOPMed/ClinVar mutations in medium containing low potassium (25 mM) grouped by growth defects. Yeast were transformed with an empty expression vector as a negative control, or with a plasmid expressing Kir2.1, ROMK, or the indicated ROMK mutation. An unstable Bartter mutant (Y314C) [15,54] was used as a negative control. In brief, yeast were grown overnight to saturation and diluted the next day to an OD600 of 0.20 with medium supplemented with 25 mM KCl. OD600 readings were recorded every 30 min for 48 hrs and normalized to wells containing medium. Graphs were made using GraphPad Prism (ver. 9.5.0), and data represent results from two replicates, ± S.E. (error bars). The growth defect categorization, e.g., “Severe defect”, was determined based on the normalized endpoint OD600 values at t = 44 hrs and are also described in details in S3 Table. Briefly, we determined the break-points for each categorization as follows: No defect, OD ≥ 1 (or 100% WT); Slight defect, 0.9 ≤ OD < 1 (90–100% WT); Moderate defect: 0.8 ≤ OD < 0.9 (80–90% WT); Severe defect: OD < 0.8 (80% WT).

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