Open-source micro-tensile testers via additive manufacturing for the mechanical characterization of thin films and papers - Fig 10

(a) Experimental data and predicted trend lines for buckle amplitude and wavelength induced in thick film (~250nm) deposited from a 0.01mg/mL solution of GO. Each data point is generated from multiple height profiles across 2–6 buckles observed at each applied strain. The error bar indicates the standard error of the measured amplitude and wavelength data. (b) Experimental data and predicted trend lines for buckle amplitude and wavelength induced in a thin film (~50 nm) deposited from a 0.0025mg/mL solution of GO. Each data point is generated from height profiles across 2–9 buckles observed at each applied strain. The error bar indicates the standard error of the measured amplitude and wavelength data.