Fig 5.tif (1.68 MB)

Latching dynamics in neural networks with synaptic depression - Fig 5

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posted on 2017-08-28, 17:25 authored by Carlos Aguilar, Pascal Chossat, Martin Krupa, Frédéric Lavigne

Panel A. Reliability of the chain of four patterns in the network of 61 neurons as a function of U. Panels B1-4. Activities of neurons coding for the patterns in the chain as a function of time for four representative values of U.

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term memories Hopfield network neurons coding Experiments point term memory formation Experiments show Latching dynamics Hebbian connectivity term synaptic depression Hopfield network models prime-target relations Hebbian rule target concept synaptic depression Prediction experiments show modelling paradigm

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